Appeal No. 1999-1796
Application 08/705,149
circuit 30 in Kang only monitors whether a complete cycle of
internal refresh address signals has been generated and does
not perform the function of "modifying performance of the
semiconductor device while it's in the self refresh test
mode." The rejection of claim 31, and its dependent claims 32
and 33, is reversed.
Claims 36 and 38-43
Claim 36 recites "an external testing device; and a
semiconductor device including: an interface for connection to
the external testing device; . . . and a self refresh test
mode controller . . . for receiving self refresh test control
signals from the external testing device through the
interface, for controlling self refresh operations of the self
refresh circuitry in response thereto . . ." (emphasis added).
Thus, claim 36 requires more than just monitoring the refresh
operation as taught by Kang. The rejection of claim 36, and
its dependent claims 38-43, is reversed.
Claims 44-46
Claim 44 recites a method including the steps of
"providing self refresh test control signals from an external
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