Ex parte HUDAK et al. - Page 4




          Appeal No. 1999-2571                                                        
          Application No. 08/820,200                                                  

          and BICMOS" and using the selected process to form the                      
          semiconductor device.  The recited processes are non-SOI                    
          fabrication processes, as explained in appellants'                          
          specification (page 3, lines 2-4).  CMOS, NMOS, PMOS, Bipolar,              
          and BICMOS circuits may be formed by such non-SOI processes or              
          by SOI processes such as silicon-on-sapphire.  Thus,                        
          disclosure of a CMOS, NMOS, PMOS, Bipolar, or BICMOS circuit                
          does not equate to a disclosure of a CMOS, NMOS, PMOS,                      
          Bipolar, or BICMOS fabrication process.                                     


               Turning to the rejection, we find that the examiner                    
          (Answer, page 3) relies on Sharma (column 1, lines 53-58, and               
          column 4, lines 30-34) as a teaching to select and use a CMOS               
          or Bipolar semiconductor device fabrication process.  However,              
          Sharma states (column 1, lines 5-8) that the invention                      
          "pertains to silicon-on-insulator (SOI) transistor                          
          technology."  Sharma (column 1, lines 9-58) goes on to discuss              
          SOI fabrication processes and the resulting CMOS and Bipolar                
          circuits.  Thus, Sharma relates to CMOS and Bipolar circuits                
          formed by SOI fabrication processes, not by CMOS and Bipolar                
          (non-SOI) processes.                                                        

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