Ex Parte MAKI - Page 2



          Appeal No. 2001-1523                                                         
          Application No. 08/731,236                                                   

               The disclosed invention is directed to a manufacturing                  
          process for a semiconductor device having semiconductor memories             
          and bipolar transistors.  The process includes forming contact               
          holes for the semiconductor memories in an insulating film, and              
          concurrently forming a plurality of openings in an insulating                
          film, and forming bipolar transistors at the locations of the                
          additional openings.  In specific embodiments, appellant’s                   
          claimed method includes forming the bipolar transistors with                 
          characteristics different from each other.                                   
              Further understanding of the invention can be obtained by               
          reading the following claim.                                                 
               1.  A manufacturing process for a semiconductor device                  
               having a semiconductor memory circuit region containing                 
               semiconductor memories, and a peripheral circuit region                 
               disposed around said semiconductor circuit region and                   
               containing bipolar transistors, said process comprising                 
               the steps of:                                                           
                    forming contact holes, for said semiconductor                      
               memories, selectively in an insulating film in said                     
               semiconductor memory circuit region;                                    
                    forming a plurality of openings selectively in an                  
               insulating film, concurrently with forming one of said                  
               contact holes, in bipolar transistor forming regions;                   
                    forming contact conductors in said contact holes;                  
               and                                                                     



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