Ex Parte LIVOLSI et al - Page 2




          Appeal No. 2003-0142                                                        
          Application No. 09/071,912                                                  


               Independent claim 1 is reproduced as follows:                          
          1.  A receiving latch with hysteresis circuit for receiving data            
          on cross chip boundaries in a chip to chip interface, comprising            
          a receiver enable input pin (E), a data line (D to L1), a                   
          receiver latch circuit section including a receiver feed section            
          (20, 115, 119, 120), a clock section (30) and a hysteresis latch            
          (40, 114,, 114' 114", 116, 116', 116", 117, 118) having a pass              
          gate (114), configured so that said receiver enable input pin (E)           
          is settable to a high (Data ON) or low (Data OFF) voltage level             
          to set the hysteresis for the receiver latch circuit section and            
          also to gate any input data at a data input pad (D) to the data             
          line setting the hysteresis of the receiver latch circuit section           
          when the voltage level at said enable input pin (E) goes high,              
          and wherein a clock signal is supplied by the clock section of              
          said receiver latch circuit section, and said receiver feed                 
          section supplies a data line output (DN) of said receiver feed              
          section to the hysteresis latch having said pass gate (114), and            
          wherein said hysteresis latch with the pass gate has clock                  
          couplings to a pgate and an ngate of a pass gate PFET (114') and            
          a pass gate NFET (114") transistor of the pass gate (114),                  
          respectively, with the drains of said pass gate PFET (114') and             
          pass gate NFET (114") being coupled to ground via a hysteresis              
          latch NFET (118) of said hysteresis latch and with the sources of           
          said pass gate PFET (114') and pass gate NFET (114") coupled to             
          the input data line via the data line output (DN) of said                   
          receiver feed section, the drain of a hysteresis latch PFET (117)           
          of said hysteresis latch having its source connected to a                   
          positive potential and the source of said hysteresis latch                  
          NFET (118) having its drain connected to ground and both said               
          hysteresis latch PFET (117) and said hysteresis latch NFET (118)            
          having their gate connection to a data line latch output (L1)               
          for gating the data line information out of the hysteresis                  
          latch (40).                                                                 
               The examiner relies on the following references:                       
          Mote, Jr.                     5,324,996             Jun. 28, 1994           
          Yoshida                       5,812,002             Sep. 22, 1998           
                                                      (filed Jun. 14, 1996)           
               Claims 1-3 stand rejected under 35 U.S.C. § 103 as                     
          unpatentable over Yoshida and Mote.                                         

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