Ex Parte Kroell et al - Page 2




          Appeal No. 2006-2382                                                         
          Application 09/902,140                                                       

          dependent upon the history during which the hardware has been                
          operated.  Therefore, cyclic operating conditions have to be                 
          investigated and simulated for circuits in SOI technology.  A                
          "functional cycle" represents a defined operating interval having            
          a start time and a stop time in which, at both times, the input              
          voltages are the same.  The invention checks if the voltage at               
          CYCLE START matches its voltage at CYCLE STOP under static (DC)              
          simulation conditions.  If not, an indication is obtained which              
          helps to automatically localize and manually correct voltage                 
          mismatches that are caused by non-cyclic input voltage waveforms.            
          Example of mismatches between CYCLE START and CYCLE STOP are                 
          described in the specification, pages 10-11.                                 
               Claim 1 is reproduced below.                                            
               1.  A method for simulating hardware circuits during which              
               voltages are calculated at a plurality of circuit nodes,                
               comprising the steps of:                                                
          (a) carrying out a first DC-simulation run at the beginning                  
                   of a functional cycle,                                              
          (b) carrying out a second DC-simulation run at the end of                    
                   said cycle,                                                         
          (c) comparing simulated values from both runs at respective                  
                   circuit nodes, and                                                  
          (d) storing mismatch information about static error                          
                   afflicted nodes at which the calculated values differ               
                   by more than a predetermined first threshold value.                 





                                        - 2 -                                          





Page:  Previous  1  2  3  4  5  6  7  8  9  10  11  Next 

Last modified: November 3, 2007