Ex Parte Li et al - Page 4

                Appeal 2007-4189                                                                               
                Application 10/164,986                                                                         
                strengths and good thermal insulation properties in the composite shadow                       
                rings of the AAPA (Answer 4).                                                                  
                      Appellants contend that there is no motivation to combine Tolles,                        
                Flach, and Clark with the AAPA because there is no correlation between the                     
                semiconductor fabrication equipment art and the construction industry art                      
                (Br. 7-8).  Accordingly, we determine that the issue presented is as follows:                  
                Has the Examiner made sufficient factual findings such that it is reasonable                   
                to conclude that one of ordinary skill in the art would have been led to                       
                combine the teachings of the references in the manner claimed within the                       
                meaning of 35 U.S.C. § 103?  We answer this question in the negative.  The                     
                issue turns on whether the Flach and Clark references are analogous to the                     
                semiconductor fabrication equipment art.                                                       
                      The Specification describes the AAPA as following:                                       
                             In still another improved design of composite shadow ring,                        
                      shown in Figures 2 and 2A, the composite shadow ring 50,                                 
                      shown in a cross-sectional view in Figure 2 and in a plane view                          
                      in Figure 2A, is constructed by an upper ring 54 and a lower ring                        
                      56.  The advantage of this configuration of two flat, concentric                         
                      rings assembled together by locating pins 60 is that only the                            
                      upper ring 54 is exposed to the plasma ions in the etch chamber                          
                      and therefore, only the upper ring 54 is subjected to the etching                        
                      effect of the plasma.  As a result, only the upper ring 54 needs to                      
                      be replaced after repeated usage of the composite shadow ring                            
                      50.  For instance, a commercially available composite shadow                             
                      ring 50 is constructed by an upper ring 54 fabricated of silicon                         
                      and a lower ring 56 fabricated of silicon dioxide.                                       
                             While the composite shadow ring 50 shown in Figure 2                              
                      presents the benefit that only the upper ring 54 is subjected to                         
                      plasma corrosion and therefore only the upper ring 54 needs to                           
                      be replaced, it presents a processing problem in that the lower                          
                      ring 56 is difficult to clean during a preventive maintenance                            
                      procedure.  The locating pins 60 which are formed of quartz                              

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