Ex parte YOSHIDA et al. - Page 5




          Appeal No. 95-1555                                                          
          Application 07/871,530                                                      


               a second liner of insulation material within the vertical              
          trench provided in said semiconductor substrate means and                   
          disposed in inwardly spaced relationship with respect to said               
          first liner of insulation material;                                         
               first conductive material filling the portion of the                   
          vertical trench within said second liner of insulation material;            
               second conductive material filling the space in said                   
          vertical trench defined between said first and second liners of             
          insulation material;                                                        
               said first and second conductive materials and said second             
          insulation liner defining a trench capacitor in which said first            
          and second conductive materials are capacitor plates and the                
          second liner of insulation material is a dielectric layer                   
          therebetween;                                                               
               a field-effect transistor provided in said semiconductor               
          substrate means and electrically connected to said trench                   
          capacitor; and                                                              
               said trench capacitor and said field-effect transistor                 
          defining a memory, cell;                                                    
               said semiconductor substrate means comprising:                         
               a semiconductor substrate of the second conductivity type,             
               a buried semiconductor layer of the first conductivity type            
          disposed on said semiconductor substrate of the second                      
          conductivity type, and                                                      
               a second layer of semiconductor material of the first                  
          conductivity type and of increased dopant concentration in                  
          relation to said buried semiconductor layer of the first                    
          conductivity type disposed on said buried semiconductor layer of            
          the first conductivity type and defining the top surface of said            
          semiconductor substrate means;                                              




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