Ex parte KAWAKAMI et al. - Page 9




          Appeal No. 95-3849                                                          
          Application 08/029,549                                                      

               The examiner applies Shiba in the rejection of claim 5                 
          only for its teaching of a metal layer on the tape guide.  It               
          appears that the examiner has overlooked relevant teachings in              
          Shiba.  Shiba shows circumferential grooves like appellants'                
          preferred embodiment (specification, page 5), although no                   
          grooves are claimed except in claim 6, which does not specify               
          the groove direction.  Although nothing is said in Shiba about              
          the use of the grooves to reduce friction due to humidity, the              
          grooves in Shiba are for the purpose of reducing friction.                  
          The crest height * in Shiba is from 5 to 20 µm.  The elevated               
          rectangular portions in Shiba have a pitch of from 0.06 mm to               
          0.25 mm, which appears to satisfy the claimed pitch range of                
          0.050 mm # x # (329*)  mm for * from 5 to 20 µm.  It is noted0.25                                                   
          that the prior art does not have to teach the expression                    
          0.050 mm # x # (329*)  mm, it only has to teach a crest pitch0.25                                                   
          within the range.  It is also noted that the claims do not                  
          preclude the crest from being flat or any other shape.  The                 
          minimum crest height * of 5 µm is slightly outside the claimed              
          range of 0.2 to 3.0 µm.  The maximum crest height is for                    
          manufacturing reasons, and is not a function of the friction:               
          "where * > 3.0 µm, a significant influence is had on the                    

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