Ex parte FOGAL - Page 6




            Appeal No. 2000-0949                                                                              
            Application No. 08/721,505                                                                        


                                               CONCLUSION                                                     

                   To summarize, the decision of the examiner to reject claims 5 and 14 under                 
            35 U.S.C. § 102 is reversed and the decision of the examiner to reject claims                     
            6-8, 15 and 20-26 under 35 U.S.C. § 103 is reversed.                                              
                                              37 CFR 1.196(b)                                                 

                   While we do not agree with the examiner with respect to the rejection under                
            35 U.S.C. § 102, in our view, claim 14 would have been obvious to one of ordinary skill in        
            the art at the time the invention was made over the combination of Holdgrafer in view of the      
            admitted prior art at column 1, lines 58-68 and column 2, lines 16-29 of the specification        
            as filed in the reissue application.3                                                             
                   Holdgrafer teaches the following limitations of claim 14:                                  


              Limitations of Claim 14                   Teachings in Holdgrafer                               
              A semiconductor device wire bonding       Holdgrafer teaches the use of the pattern             
              method                                    recognition in a wire bonding system.                 
              providing a semiconductor die having a    Holdgrafer teaches the use of the vision              
              plurality of bond pads thereon connected system for use with dies with plural bond              
              to integrated circuits formed on the die; pads as shown in figures 1-3.                         





                   We have only applied the prior art to claim 14 for the sake of brevity and to address the aspect of3                                                                                         
            "determining the longitudinal axis."   We leave the remainder of the claims for the examiner to evaluate and
            make determinations thereto.                                                                      
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