Ex Parte KALTER et al - Page 1




            The opinion in support of the decision being entered today was not written
                   for publication and is not binding precedent of the Board.         

                                                                 Paper No. 20         

                       UNITED STATES PATENT AND TRADEMARK OFFICE                      
                                     ____________                                     
                          BEFORE THE BOARD OF PATENT APPEALS                          
                                   AND INTERFERENCES                                  
                                     ____________                                     
            Ex parte HOWARD L. KALTER, H. BERNHARD POGGE, GEORGE S. PROKOP            
                                 and DAVID L. WHEATER                                 
                                     ____________                                     
                                 Appeal No. 2003-2137                                 
                              Application No. 09/236,183                              
                                     ____________                                     
                                       ON BRIEF                                       
                                     ____________                                     
          Before KIMLIN, GARRIS, and WALTZ, Administrative Patent Judges.             
          WALTZ, Administrative Patent Judge.                                         


                                  DECISION ON APPEAL                                  
               This is a decision on an appeal from the primary examiner’s            
          final rejection of claims 4 through 9, which are the only claims            
          pending in this application.  We have jurisdiction pursuant to              
          35 U.S.C. § 134.                                                            
               According to appellants, the invention is directed to a method         
          of testing chip functionality by depositing one additional layer of         
          passivation and one layer of sacrificial metal, with the test               
          circuitry in the kerf with the connections at the sacrificial metal         







Page:  1  2  3  4  5  6  7  8  9  10  Next 

Last modified: November 3, 2007