Ex Parte Abraham et al - Page 7




               Appeal No. 2006-2344                                                                                             
               Application No. 10/408,890                                                                                       

               interpretation...will normally control the remainder of the decisional process.”  Panduit Corp. v.               
               Dennison Mfg., 810 F.2d 1561, 1567-68, 1 USPQ2d 1593, 1597 (Fed. Cir. 1987).                                     
                      We note that representative claim 1 reads in part as follows:                                             
                            [A] measuring table that has a wafer table equipped with a rotary drive, wherein the                
                            wafer table is cup-shaped and has at least one support edge for a wafer, which is                   
                            provided with an adhesive material, wherein in an interior of the wafer table a wafer               
                            alignment device is arranged, and wherein over the wafer table, a displaceable                      
                            measuring head is arranged in which a measuring device and a notch detector are                     
                            integrated.                                                                                         
                      We note that at pages 7 and 8, Appellants’ specification states the following:                            
                              FIG 1 is a top view of a measurement module 1 comprising a measuring table 2 and a                
                              measuring head 7. The  measuring table 2 - as shown in FIG 2 - has a base plate 8                 
                              carrying a rotary motor 11 with a wafer table 10 on  which a wafer 4 is placed. The               
                              wafer 4 has a notch 5 and during the measurement is rotated in the direction of the               
                              arrow by means of the wafer table 10 (see FIG 1).                                                 
                              Two linear motors 3a, 3b that are interconnected by a support 6 are arranged on two               
                              sides of the wafer table 10. On the support 6, a measuring head 7 is arranged,                    
                              which can thus be displaced in a linear motion during the measurement. The                        
                              measuring head 7 comprises a  measuring device (not depicted) and a notch detector                
                              20 that will be described in greater detail in connection with FIG 5 and 6.                       
                              On the table sector l0a, the wafer table 10 is provided with two annular support edges            
                              13, 14, each of which is equipped with several adhesive strips 15a, 15b.                          

                      Thus, the claim does require a measuring table having a cup-shaped wafer table with a rotary              
               drive and a support edge with adhesive material, wherein an alignment device is arranged in the                  
               interior of the wafer table and a displaceable measuring head is arranged over the wafer table to                
               thereby integrate a measuring device and a notch detector.                                                       




                                                               7                                                                




Page:  Previous  1  2  3  4  5  6  7  8  9  10  11  12  13  14  15  Next 

Last modified: November 3, 2007