Ex Parte Hubacek et al - Page 5

                Appeal 2007-0127                                                                              
                Application 09/749,916                                                                        

           1          5.  The Applicants’ parallel-plate showerhead electrode is said to be                   
           2    mountable to a support member by an elastomeric conductive joint.                             
           3    (Specification, p. 3, ll. 25-26).                                                             
           4          6.  The Applicants’ parallel-plate showerhead electrode is said to be                   
           5    able to form plasma by energizing process gas via radio frequency                             
           6    electromagnetic (RF) waves. (Specification, p. 4, ll. 26-29).                                 
           7          7.  A silicon wafer is said to be etched with the plasma.                               
           8    (Specification, p. 4, ll. 26-29).                                                             
           9          8.  The specification teaches that the electrode according to the                       
          10    invention can couple power into the plasma more efficiently and with less                     
          11    heat build up.  (Specification, p. 5, ll. 3-4).                                               
          12          9.  The Applicants’ electrode is said to be clamped to a support                        
          13    member by a plasma confinement ring. (Specification, p. 8, ll. 11-12).                        
          14          10.  The Appellants’ confinement ring is said to be fabricated from a                   
          15    dielectric material, ceramic material, dielectric coated metal, or other                      
          16    material.  (Specification, p. 8, ll. 21-25).                                                  
          17          11.  The confinement ring is said to cause a pressure differential in the               
          18    reactor and increase the electrical resistance between the reaction chamber                   
          19    walls and the plasma thereby confining the plasma between the upper and                       
          20    lower electrodes.  (Specification, p. 8, ll. 9-30; p. 9, ll. 16-19).                          
          21                                       Degner                                                     
          22          12.  Degner describes the use of parallel plate plasma reactors for                     
          23    etching (col. 1, ll. 24-25).                                                                  




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