Appeal 2007-0127 Application 09/749,916 1 43. Murai teaches that the amount of the doping gas supplied varies 2 depending on the size of the chamber, number of sheets to be doped, speed 3 of the doping process, and other factors. (Translation, p. 6, last 3 lines). 4 Saito 5 44. Saito describes a parallel plate plasma etching electrode. (col. 1, 6 ll. 6-7). 7 45. Saito teaches that conventional electrodes wear down during 8 plasma etching. (col. 1, ll. 20-25) 9 46. Saito describes a plasma electrode of single crystal silicon with 10 holes of 0.5 mm bored into the electrode. (col. 3, ll. 15-18). 11 47. Saito describes multiple electrodes (Ex. 1-22, Tbl. 1, col. 3-4) 12 with electric resistivities of 35, 15, 2, 0.1, 0.01, and 0.003 ohm-cm. 13 Uwai 14 48. Uwai describes a plasma etching electrode plate for etching a 15 wafer. (col. 1, ll. 10-13). 16 49. Uwai teaches a thicker electrode is better than a thinner electrode 17 for durability. (col. 2, ll. 62-63). 18 50. Uwai teaches avoiding thin, warpable sheet electrodes for 19 durability. (col. 2, ll. 60-65). 20 51. Uwai describes keeping surface temperatures uniform across the 21 plate of the electrode. (Id). 22 52. Uwai teaches that a thermally conductive, thick electrode plate 23 effectively suppresses the fluctuation of surface temperature distribution and 24 results in a uniform etching rate and a long life. (col. 4, ll. 27-36). 9Page: Previous 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 Next
Last modified: September 9, 2013