Appeal 2007-0576
Application 10/025,816
A. INVENTION
The invention at issue on appeal concerns self-testing of memories.
Memories sometimes feature built-in self-test ("BIST") mechanisms for
conducting self-tests to detect any memory defects. Because defects may
vary from design to design and may vary with different fabrication processes
applied to the same design, explain the Appellants, self-test methodologies
are selected and tuned to a particular design and fabrication technique by the
concerned manufacturer. A manufacturer will typically have a preferred test
methodology that experience has taught is well suited to its particular
environment. The test methodology adopted by one manufacturer, however,
may not work for another manufacturer. (Specification 2.)
By varying address sequencing, in contrast, the Appellants'
programmable self-test controller allows different test methodologies to be
performed. (Id. 3.) Their self-test controller can handle the different test
requirements of different manufacturers or the different test requirements
that may arise for a single manufacturer as it develops its fabrication
processes. (Id. 3-4.)
Claim 1, which further illustrates the invention, follows:
1. Apparatus for processing data, said apparatus comprising:
at least one memory having a plurality of memory
storage locations associated with respective memory addresses;
and
a self-test controller operable to control self-test of said at
least one memory; wherein
2
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