Appeal 2007-0576
Application 10/025,816
Dictionary," (Pre-Appeal Brief Request for Review 1), their Evidence
Appendix omits the definition, instead indicating "None." (Br. A12.) The
Appellants should provide a copy of the definition in their next
communication with the United States Patent and Trademark Office.
III. ISSUE
Rather than reiterate the positions of the Examiner or the Appellants
in toto, we focus on the issue therebetween. The Examiner makes the
following assertion.
Lo teaches the claimed ''a self-test instruction specifying a test
methodology''. For example, if one skilled in the art using Lo's
ABIST engine 12 received a single 9-bit word (a self-test
instruction) from the Microcode Array 10 containing a "010''
in the Micro-code Array Address Pointer field 14, a "1'' in the
Address Increment field 15, "000'' in the Data Pattern Control
field 16, a "1'' in the Read/Write Control Field 17, and a "1'' in
the End-of -Address-Space Control field 18 from the
Microcode Array 10, that is 0101000111 [sic], a test
methodology (i.e. a body of methods, rules, and postulates
employed by a discipline: a particular procedure or set of
procedures) would be executed to set the ABIST engine 12 in
write mode (Read/ Write Control Field 17, Col. 11, Table 8),
increment the memory address (Address Increment field 15,
Col. 10, Table 6), Shift and Rotate (Data Pattern Control field
16, Col. 10, Table 7), detect the end of address (End-of -
Address-Space Control field 18, Col. 11, Table 9) and do all
this repeatedly (hold the ROM pointer) until the address space
has been fully explored at which time the ROM pointer is
incremented to one (Micro-Code Array Address Pointer
field 14, Table 5, Col. 8). These ''set of procedures'' (specifying
a test methodology) are executed as a result of one single 9-bit
word (a self-test instruction) read from the microcode
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