Ex parte BEASOM - Page 8

          Appeal No. 96-1584                                                          
          Application 08/066,697                                                      

          rejection of claims 20 and 21 stands or falls with the rejection            
          of claims 2 and 3, as applied to claim 24.                                  
                     CLAIMS 22, 23, 4-6, 8, 9, 13-15, 17 and 18                       
               After consideration of the positions and arguments presented           
          by both the examiner and the appellants, we have concluded that             
          the rejection of claims 22, 23, 4-6, 8, 9, 13-15, 17 and 18                 
          should be sustained.  We agree in general with the comments made            
          by the examiner; we add the following discussion for emphasis.              
               With respect to claim 22, appellant asserts to the effect              
          that the claim requires that the PN junction in the island region           
          be spaced apart from the sidewalls of the island region whereat             
          the dielectric material is formed, on the one hand, and that the            
          high-to-low impurity concentration junction intersect the                   
          sidewalls of the island region and notes that neither embodiment            
          of Muramatsu relied on by the examiner, FIGS. 2 and 5g, includes            
          these two features.  Still further, appellant argues to the                 
          effect that Muramatsu does not specifically teach that its trench           
          material 20 is coupled to receive a bias voltage that is                    
          insufficient to cause the avalanche-generation of electron-hole             
          pairs in the vicinity of the relatively high-to-low impurity                
          concentration junction.                                                     


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