Ex parte SWOBODA et al. - Page 3




          Appeal No. 94-3053                                                          
          Application 07/832,661                                                      



          circuit to monitor another processor on a semiconductor chip.               
          The serial scan circuit is used to set the invention’s proces-              
          sor to particular predetermined conditions and then check the               
          chip’s                                                                      


          processor for the existence of such conditions.  When a                     
          predetermined condition is met, the invention’s processor                   
          controls the operation of the monitored processor.                          
                    Independent claim 55 is reproduced as follows:                    
                    55. A data processing device comprising:                          
                    a semiconductor chip;                                             
                    an electronic processor on-chip;                                  
                    an on-chip condition sensor connected to said                     
                    electronic processor for analysis of the operations               
                    thereof, including means for recognizing the                      
                    occurrence of a predetermined condition during real               
                    time operation of said electronic processor and                   
                    means responsive to the recognition of said                       
                    predetermined condition for applying a control input              
                    to said electronic processor during said real time                
                    operation thereof; and                                            
                    a serial scan circuit connected to said on-chip                   
                    condition sensor for inputting to said on-chip                    
                    condition sensor control information which causes                 

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Last modified: November 3, 2007