Ex parte CLINE - Page 1




             The opinion in support of the decision being entered today was not written
             for publication in a law journal and is not binding precedent of the Board.
                                                                 Paper No. 14         
                       UNITED STATES PATENT AND TRADEMARK OFFICE                      
                                     ____________                                     
                          BEFORE THE BOARD OF PATENT APPEALS                          
                                   AND INTERFERENCES                                  
                                     ____________                                     
                                Ex parte DANNY R. CLINE                               
                                     ____________                                     
                                 Appeal No. 1997-2247                                 
                              Application No. 08/259,798                              
                                     ____________                                     
                                       ON BRIEF                                       
                                     ____________                                     
          Before HAIRSTON, JERRY SMITH, and BARRY, Administrative Patent              
          Judges.                                                                     
          BARRY, Administrative Patent Judge.                                         


                                  DECISION ON APPEAL                                  
               This is a decision on appeal under 35 U.S.C. § 134 from                
          the  rejection of claims 1-12.  We affirm-in-part.                          


                                     BACKGROUND                                       
               The invention at issue in this appeal relates to stress                
          testing an integrated circuit (IC) memory.  Stress testing is               
          commonly used to learn when an IC memory is expected to fail                
          prematurely during normal use.  Because only a few of tens of               







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