Ex Parte PETTERSSON et al - Page 6



            Appeal No. 2000-2109                                                                         
            Application No. 09/159,609                                                                   

            Examiner states that "Applicant states that Temple et al. do not                             
            show the formation of a dE-E detector, which is true but note                                
            that Temple et al. are relied upon to show wafer bonding."  See                              
            page 6, lines 7 and 8 of the Answer.                                                         
                  In rejecting claims under 35 U.S.C. § 103, the Examiner                                
            bears the initial burden of establishing a prima facie case of                               
            obviousness.  In re Oetiker, 977 F.2d 1443, 1445, 24 USPQ2d 1443,                            
            1444 (Fed. Cir. 1992).  Further, our reviewing court in In re                                
            Dembiczak, 175 F.3d 994, 999-00, 50 USPQ2d 1614, 1617 (Fed. Cir.                             
            1999) has said,                                                                              
                  Broad conclusory statements regarding the teaching of                                  
                  multiple references, standing alone, are not                                           
                  'evidence.'  E.g., McElmurry v. Arkansas Power & Light                                 
                  Co., 995 F.2d 1576, 1578, 27 USPQ2d 1129, 1131 (Fed.                                   
                  Cir. 1993) ("Mere denials and conclusory statements,                                   
                  however, are not sufficient to establish a genuine                                     
                  issue of material fact.");  In re Sichert, 566 F.2d                                    
                  1154, 1164, 196 USPQ 209, 217 (CCPA 1977).                                             
                  We note that the Appellants' claim 1 recites the following:                            
                  a )E-E detector telescope is fabricated by wafer                                       
                  bonding a )E detector portion in the form of a first                                   
                  semiconductor wafer to an E detector portion in the                                    
                  form of a second semiconductor wafer by silicidizing a                                 
                  thin metal layer . . .   .  (Emphasis added).                                          
            In understanding these claim limitations, we find that                                       
            Appellants' claim calls for two distinct wafers that are bonded                              
            via silicidizing a thin metal layer so as to form the )E-E                                   
                                                   66                                                    




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