Appeal 2007-1269 Application 10/636,468 that the Examiner erred in rejecting claim 63 as being obvious over Pasadyn and Liu. Regarding claim 1, Appellants argue that "Pasadyn does not teach or suggest calculating a process rate by subtracting post-process measurement data from pre-process measurement data and dividing the result by a total processing time, as recited by claim 1." (Br. 9.) Further, Appellants argue that "Liu teaches a mid-process measurement to determine a total processing time for each polished substrate" (Br. 10). Therefore, Appellants assert that: Liu does not teach or suggest calculating a process rate by subtracting post-process measurement data from pre-process measurement data and dividing the result by a total processing time, as recited by claim 1, because the total processing time never [sic] calculated by Liu, and the remaining processing time is the resultant [sic] that is calculated by Liu using the mid-process measurement. (Br. 10 (emphasis in original).) We disagree. Liu discloses collecting a reference oxide layer thickness measurement prior to a polishing process, collecting an oxide layer thickness measurement after a first polishing time period, and calculating a process rate. (FF 6-7.) The Examiner correctly found that Liu is not limited to a 3 The Briefs and the Answer purport to argue claim 5, but instead quote and argue the substance of the language of claim 6. (See, e.g., Br. 12; Answer 10.) Under these circumstances, we will treat the arguments as being directed to claim 6 and will consider the references to claim 5 to be typographical errors. To the extent that the Appellants meant to refer to claim 5, we agree with the Examiner's finding that Pasadyn discloses that both pre-process measurement data and post-process measurement data each include both thickness measurement and critical dimension information, as recited by claim 5. (Answer 10.) 12Page: Previous 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 Next
Last modified: September 9, 2013