Ex Parte Mui et al - Page 12

                Appeal 2007-1269                                                                              
                Application 10/636,468                                                                        
                that the Examiner erred in rejecting claim 63 as being obvious over Pasadyn                   
                and Liu.                                                                                      
                      Regarding claim 1, Appellants argue that "Pasadyn does not teach or                     
                suggest calculating a process rate by subtracting post-process measurement                    
                data from pre-process measurement data and dividing the result by a total                     
                processing time, as recited by claim 1."  (Br. 9.)  Further, Appellants argue                 
                that "Liu teaches a mid-process measurement to determine a total processing                   
                time for each polished substrate" (Br. 10).  Therefore, Appellants assert that:               
                             Liu does not teach or suggest calculating a                                      
                             process rate by subtracting post-process                                         
                             measurement data from pre-process measurement                                    
                             data and dividing the result by a total processing                               
                             time, as recited by claim 1, because the total                                   
                             processing time never [sic] calculated by Liu, and                               
                             the remaining processing time is the resultant [sic]                             
                             that is calculated by Liu using the mid-process                                  
                             measurement.                                                                     
                (Br. 10 (emphasis in original).)  We disagree.                                                
                      Liu discloses collecting a reference oxide layer thickness                              
                measurement prior to a polishing process, collecting an oxide layer thickness                 
                measurement after a first polishing time period, and calculating a process                    
                rate.  (FF 6-7.)  The Examiner correctly found that Liu is not limited to a                   
                                                                                                             
                3  The Briefs and the Answer purport to argue claim 5, but instead quote and                  
                argue the substance of the language of claim 6.  (See, e.g., Br. 12; Answer                   
                10.)  Under these circumstances, we will treat the arguments as being                         
                directed to claim 6 and will consider the references to claim 5 to be                         
                typographical errors.  To the extent that the Appellants meant to refer to                    
                claim 5, we agree with the Examiner's finding that Pasadyn discloses that                     
                both pre-process measurement data and post-process measurement data each                      
                include both thickness measurement and critical dimension information, as                     
                recited by claim 5.  (Answer 10.)                                                             
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