Ex Parte Pan et al - Page 7



          Appeal No. 2005-0323                                       Page 7           
          Application No. 09/577,835                                                  

          regions.  However, appellants argue to the effect that (brief,              
          page 8) Mogami does not disclose a composite sidewall structure             
          that extends from a bottom to a top of the continuously vertical            
          sidewalls.  It is argued (id.) that there is no motivation to               
          combine the teachings of Gardner and Mogami because Gardner                 
          already includes a mechanism (figure 9) for avoiding short                  
          circuits between the gate electrode and the source/drain regions.           
          It is further argued (id.) that if the oxide portion of Gardner             
          were lengthened, there would be no need for the nitride portion             
          of the spacer in Gardner.  Additionally, appellants argue that              
          combining the teachings of Gardner and Mogami would not result in           
          the claimed invention because the resultant structure would have            
          an oxide layer that runs from at least a bottom of the stack to             
          above a top of the sidewall.                                                
               The examiner responds (answer, page 5) that with regard to             
          appellants' assertion that there is no motivation to combine the            
          teachings of Gardner and Mogami, that in Mogami, the spacer                 
          structure extends above the top surface of the gate stack, and              
          that therefore, the silicide material on top of the gate                    
          conducting layer cannot bridge between the gate stack and the               
          source/drain region, resulting in prevention of a short circuit             
          between the gate stack and the source/drain region.  With regard            





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