Appeal No. 96-0511
Application 08/158,837
means for writing predetermined external data for
functional testing of said plurality of memory cells
into each single row of said plurality of preliminary
memory cells;
means for temporarily storing said external data
written by said writing means;
means for simultaneously transferring said external
data in each single row of said preliminary memory
cells connected to one of said preliminary word lines
to a corresponding single row of said plurality of
memory cells connected to one of said word lines
via said bit lines connecting said plurality of memory
cells and preliminary memory cells;
means for simultaneously reading data from each
single
row of said plurality of memory cells; and
means for simultaneously comparing all of said data
read by said reading means with all of said external
data temporarily stored in said temporarily storing
means via bit lines connecting said plurality of memory
cells and preliminary memory cells, to detect whether
or not there is a defect in any of the rows of said
plurality of memory cells.
25. The semiconductor memory device according to claim
23, wherein
said means for simultaneously comparing comprises
means for comparing all of said read data and all of said
temporarily stored external data in the
correspondence of one to one
We note that although all of the appealed claims include
limitations which appear to be in proper means-plus-function
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